Dr Boland's research interests are focused on revealing the ultrafast carrier dynamics of novel nanomaterials via terahertz spectroscopy. She is an expert in ultrafast optical-pump terahertz-probe spectroscopy - a non-contact technique for directly extracting the dielectric function and photoconductivity of a material. She has utilised this technique on semiconductor nanostructures, demonstrating accurate characterisation of their key optoelectronic properties, including carrier mobility, carrier lifetime and both intrinsic and extrinsic carrier concentration. She has also utilised near-field scattering-type midinfrared microscopy to demonstrate increased spatial resolution down to the nanometre-scale, performing nanotomography on topological insulator thin films. She is currently applying this technique to the terahertz range, combining scattering-type near-field optical microscopy with optical-pump terahertz-probe spectroscopy to provide a surface-sensitive probe of electrical conductivity and photoconductive with sub-picosecond temporal and nanometre spatial resolution. Her research focuses on exploiting this technique alongside far-field terahertz spectroscopy to reveal the ultrafast carrier dynamics of topological insulators, 2D materials and III-V nanowires.
Ultrafast terahertz time-domain spectroscopy
Ultrafast optical-pump terahertz-probe spectroscopy
Terahertz scattering-type near-field optical microscopy (THz-SNOM)