The Offset DropletCitation formats

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The Offset Droplet : A new methodology for studying the solid/water interface using X-Ray Photoelectron Spectroscopy. / Booth, Samuel; Tripathi, Alok Mani; Strashnov, Ilya; Dryfe, Robert; Walton, Alex.

In: Journal of Physics: Condensed Matter, 2017.

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Author

Booth, Samuel ; Tripathi, Alok Mani ; Strashnov, Ilya ; Dryfe, Robert ; Walton, Alex. / The Offset Droplet : A new methodology for studying the solid/water interface using X-Ray Photoelectron Spectroscopy. In: Journal of Physics: Condensed Matter. 2017.

Bibtex

@article{dfdd8fcdff9c4625b7c3060893323abb,
title = "The Offset Droplet: A new methodology for studying the solid/water interface using X-Ray Photoelectron Spectroscopy",
abstract = "The routine study of the solid-water interface by XPS is potentially revolutionary as this development opens up whole new areas of study for photoelectron spectroscopy. To date this has been realised by only a few groups worldwide and current techniques have significant restrictions on the type of samples which can be studied. Here we present a novel and uniquely flexible approach to the problem. By introducing a thin capillary into the NAP-XPS, a small droplet can be injected onto the sample surface, offset from the analysis area by several mm. By careful control of the droplet size a water layer of controllable thickness can be established in the analysis area - continuous with the bulk droplet. We present results from the solid-water interface on a vacuum prepared TiO2(110) single crystal and demonstrate that the solid/liquid interface is addressable.",
author = "Samuel Booth and Tripathi, {Alok Mani} and Ilya Strashnov and Robert Dryfe and Alex Walton",
year = "2017",
doi = "10.1088/1361-648X/aa8b92",
language = "English",
journal = "Journal of Physics: Condensed Matter",
issn = "0953-8984",
publisher = "IOP Publishing Ltd.",

}

RIS

TY - JOUR

T1 - The Offset Droplet

T2 - A new methodology for studying the solid/water interface using X-Ray Photoelectron Spectroscopy

AU - Booth, Samuel

AU - Tripathi, Alok Mani

AU - Strashnov, Ilya

AU - Dryfe, Robert

AU - Walton, Alex

PY - 2017

Y1 - 2017

N2 - The routine study of the solid-water interface by XPS is potentially revolutionary as this development opens up whole new areas of study for photoelectron spectroscopy. To date this has been realised by only a few groups worldwide and current techniques have significant restrictions on the type of samples which can be studied. Here we present a novel and uniquely flexible approach to the problem. By introducing a thin capillary into the NAP-XPS, a small droplet can be injected onto the sample surface, offset from the analysis area by several mm. By careful control of the droplet size a water layer of controllable thickness can be established in the analysis area - continuous with the bulk droplet. We present results from the solid-water interface on a vacuum prepared TiO2(110) single crystal and demonstrate that the solid/liquid interface is addressable.

AB - The routine study of the solid-water interface by XPS is potentially revolutionary as this development opens up whole new areas of study for photoelectron spectroscopy. To date this has been realised by only a few groups worldwide and current techniques have significant restrictions on the type of samples which can be studied. Here we present a novel and uniquely flexible approach to the problem. By introducing a thin capillary into the NAP-XPS, a small droplet can be injected onto the sample surface, offset from the analysis area by several mm. By careful control of the droplet size a water layer of controllable thickness can be established in the analysis area - continuous with the bulk droplet. We present results from the solid-water interface on a vacuum prepared TiO2(110) single crystal and demonstrate that the solid/liquid interface is addressable.

U2 - 10.1088/1361-648X/aa8b92

DO - 10.1088/1361-648X/aa8b92

M3 - Article

JO - Journal of Physics: Condensed Matter

JF - Journal of Physics: Condensed Matter

SN - 0953-8984

ER -