Return of asynchronous logic

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Integrated circuits (ICs) based on asynchronous logic design are enjoying a resurgence as more and more circuit designers realize the advantages of this design concept over clock designs. Clock circuits waste power by clocking all parts of the chip and must be margined for worst case processes, unlike asynchronous logic ICs which allow optimum hardware concurrency and offers improve electromagnetic compatibility. However, production quality assurance techniques must first be enhanced to address the complexities involved in the testing of such circuits.

Bibliographical metadata

Original languageEnglish
Title of host publicationIEEE International Test Conference (TC)
PublisherIEEE
Pages938
Number of pages1
Publication statusPublished - 1996
EventProceedings of the 1996 IEEE International Test Conference - Washington, DC, USA
Event duration: 20 Oct 199624 Oct 1996

Conference

ConferenceProceedings of the 1996 IEEE International Test Conference
CityWashington, DC, USA
Period20/10/9624/10/96