High Resolution Chemical Analysis of Electrical Trees through AFM-IR Spectroscopy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Accurate modelling of electrical tree growth is dependent upon a physical and chemical understanding of the insulation and degradation processes on the scale of the tree branches. While imaging techniques for the physical elements of tree growth have improved in recent years, those for the chemical regime are lagging behind. In this paper AFM-IR (Atomic Force Microscopy - Infrared Spectroscopy) is applied to a non-conducting tree channel grown in epoxy resin. This provides chemical analysis with a spatial resolution of 50 nm. The distinct chemistries from within buried channels, exposed channels and the epoxy bulk are revealed for the first time.

Bibliographical metadata

Original languageEnglish
Title of host publication2019 IEEE Electrical Insulation Conference
Publication statusAccepted/In press - 12 Jun 2019
Event2019 Electrical Insulation Conference - Calgary, Canada
Event duration: 16 Jun 201919 Jun 2019

Conference

Conference2019 Electrical Insulation Conference
Abbreviated titleEIC 2019
CountryCanada
CityCalgary
Period16/06/1919/06/19