Electron inelastic mean free paths for carbon nanotubes from optical data

Research output: Contribution to journalArticle

  • Authors:
  • Ioanna Kyriakou
  • Dimitris Emfietzoglou
  • Rafael Garcia-Molina
  • Isabel Abril
  • Kostas Kostarelos


We present a simple model dielectric response function for both bulk and individual carbon nanotubes based on a parameterization of experimental optical data and analytic dispersion relations that account for dimensionality and linewidth broadening. The model is used to calculate electron inelastic mean free paths over a broad energy range of interest to various applications. © 2009 American Institute of Physics.

Bibliographical metadata

Original languageEnglish
Article number263113
JournalApplied Physics Letters
Issue number26
Publication statusPublished - 2009