Development of a Dual-temperature Test Cell for Laboratory Ageing Experiment of Transformer Insulation Systems

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • External authors:
  • Shanika Matharage
  • Christoph Krause
  • Attila Gyore
  • Luke Van der Zel

Abstract

As accelerated ageing tests in full-size transformers are impractical, laboratory ageing experiments are often used to understand the ageing process of transformer insulation systems. Three main types of ageing experiment setup can be identified in literature: a functional life test model, a dual-temperature test cell and a single temperature test cell. A functional life test model is a scaled-down representation of transformer operation, but it is very expensive to run. A single temperature test cell is the simplest and most widely used laboratory test set-up but it cannot reflect the different temperature profiles and gradients found inside a real transformer. The dual-temperature test cell is less complicated and less costly than the transformer model and still has the ability to simulate the different temperatures experienced by transformer insulation. In a dual temperature cell the solid and liquid insulation temperatures are independently controlled, thereby overcoming the main disadvantage of the single temperature test cell method. In this paper, the design and construction of a dual-temperature test system based on the IEC TS 62332-1 technical specification is described and test results are provided to show that the test system fulfils the desired functions with stable conductor and liquid temperatures.

Bibliographical metadata

Original languageEnglish
Title of host publication2020 IEEE International Conference on High Voltage Engineering and Application
PublisherIEEE
Publication statusAccepted/In press - 16 Jul 2020
Event2020 IEEE International Conference on High Voltage Engineering and Application - Tsinghua University, Beijing, China
Event duration: 6 Sep 202010 Sep 2020

Conference

Conference2020 IEEE International Conference on High Voltage Engineering and Application
Abbreviated titleICHVE 2020
Country/TerritoryChina
CityBeijing
Period6/09/2010/09/20