Characterisation of Size Distribution and Positional Misalignment of Nanoscale Islands by Small-Angle X-ray Scattering

Research output: Contribution to journalArticle

  • External authors:
  • Georg Heldt
  • Rajesh V. Chopdekar
  • Joachim Kohlbrecher
  • Stephen Lee
  • Laura J. Heyderman

Abstract

Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications and data storage as Bit Patterned Media (BPM). We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy (SEM) images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate and statistically reliable method for characterising arrays of ordered nanostructures.

Bibliographical metadata

Original languageEnglish
JournalJournal of Applied Physics
Early online date2 Jan 2019
DOIs
Publication statusPublished - 2019

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